Materials characterization in the semiconductor and electronics industry focuses on analyzing the surface of finished wafers, especially for characterizing the lithography and line integrity, failure and defect analysis on patterned wafers, and advanced materials development for creating nanostructures. For over 30 years materials characterization has been critical in developing the semiconductors and electronic circuitry that is so critical to all of modern technology. Reliable and high performance electronics in military, aerospace, and automotive applications require sophisticated tools in all aspects from materials and process development, to problem solving, failure analysis, and QA/QC testing. Our examples will focus on AFM and SEM analysis of lithography, failure analysis of finished semiconductor devices, and QA/QC of electronic circuit boards. We will also look at QA/QC testing of high-purity gas lines developed for the exacting standards of particle free manufacturing, and failure analysis and contamination control in clean room environments.
Problem 1 - AFM and SEM image analysis and characterization of lithography
Problem 2 - Failure analysis of finished semiconductor wafers
Problem 3 - Materials characterization to support process and materials development in nanoelectronics
Problem 4 - Materials characterization to support process development and QA/QC of high-purity gas lines in clean room manufacturing.
Copyright © 2006 - 2007 Robert D. Cormia - January 1, 2007